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| View | ID# | Make | Model | Class | Description | |||||||||
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S-GL-022
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NexTest
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Magnum
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Memory ATE
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The big brother of the Maverick, the Magnum has a more limited installed base due to its higher pincount focus and shift in the FLASH test market....
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S-GL-060
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Advantest
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T5385
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Memory ATE
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This latest 768-site single-station tester from Advantest is targeted for wafer sort of FLASH and DRAM memory devices. Still limited availablity....
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S-GL-061
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Advantest
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T5385ES
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Memory ATE
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Designed for engineering use, this smaller version of the T5385 will have limited marketability. Please contact us to verify availability,...
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S-GL-062
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Advantest
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T5383
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Memory ATE
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The T5383 is a 384-site single-station tester designed for DDR SDRAM, SRAM, and FLASH wafer sort. Please contact us to verify availability,...
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S-GL-063
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Advantest
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T5377
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Memory ATE
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This two-station 128-site tester introduced in 2003 gained a large installed base during the memory segment buying in the mid-2000s. Please...
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S-GL-064
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Advantest
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T5377S
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Memory ATE
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This single-station version of the 128-site T5377, began the trend of single-station wafer sort solutions in the memory industry. Please contact...
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S-GL-065
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Advantest
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T5375
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Memory ATE
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The first 128-site DDR tester, the T5375 was widely used and still sees some trading today. Please contact us to verify availability,...
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S-GL-066
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Advantest
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T5503
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Memory ATE
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The latest at-speed tester from Advantest, the capabilities reach 3.2Gbps for DDR3/GDDR4, but the installed base and availability is very limited....
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S-GL-067
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Advantest
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T5593
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Memory ATE
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Like most at-speed memory testers, the T5593 is highly capable for testing DDR2, but limited in its customer base and market activity. Please...
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S-GL-068
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Advantest
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T5592
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Memory ATE
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The T5592 is Advantest's DDR at-speed test solution, introduced in 2000 with 32 sites, two stations, and 1.066GHz top DDR speeds. Please contact us...
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S-GL-069
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Advantest
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T5588
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Memory ATE
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Though introduced in 2005, the T5588 is still the memory industry's mainstream core functional test solution, with very few released to the market....
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S-GL-070
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Advantest
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T5585
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Memory ATE
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The T5585 was introduced in 1999 and only boasts 128 sites per station, but is still widely used for core memory testing. Please contact us to...
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S-GL-071
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Advantest
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T5773
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Memory ATE
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The T5773 introduced in 2011 addresses the diverse NAND FLASH memory test market with 768 sites up to 400Mbps. Please contact us to verify...
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S-GL-072
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Advantest
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T5782
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Memory ATE
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Introduced in 2009, the T5782 provided a 256-site solution for the FLASH and MCP test markets. Please contact us to verify availability,...
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S-GL-073
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Verigy
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V6000
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Memory ATE
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A massively parallel FLASH wafer sort solution, the V6000 saw limited adoption due in part to the timing of its introduction in 2009. Please...
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S-GL-074
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Verigy
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V5400
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Memory ATE
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The V5400 was Verigy's most popular FLASH wafer sort solution, but still with very small customer base. Please contact us to verify availability,...
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S-GL-075
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Agilent
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V4400
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Memory ATE
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The V4400 was popular during the growth of the FLASH memory market, but has little market activity today. Please contact us to verify...
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