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Memory ATE

Memory ATE

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View ID# Make Model Class Description
ID# 91678
Advantest T5375
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Make Advantest
Model T5375
Class Memory ATE
91678
Advantest
T5375
Memory ATE
The Advantest T5375 is a smaller foot-print, older model memory test system . We would like to hear about any available dual-headed systems.
ID# 91992
Advantest T5511
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Make Advantest
Model T5511
Class Memory ATE
91992
Advantest
T5511
Memory ATE
Please let us know about any configurations you might have available.
ID# 92103
Advantest T5375
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Make Advantest
Model T5375
Class Memory ATE
92103
Advantest
T5375
Memory ATE
Advantest T5375 Memory Test system (single or dual test head ok) with M6541AD handlers. Let us know what you have available, even if it is...
ID# 92386
Advantest T5377S
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Make Advantest
Model T5377S
Class Memory ATE
92386
Advantest
T5377S
Memory ATE
Several systems needed for CP testing. Must have FRMA board. All configurations considered.
ID# S-GL-022
NexTest Magnum
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Make NexTest
Model Magnum
Class Memory ATE
S-GL-022
NexTest
Magnum
Memory ATE
The big brother of the Maverick, the Magnum has a more limited installed base due to its higher pincount focus and shift in the FLASH test market....
ID# S-GL-060
Advantest T5385
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Make Advantest
Model T5385
Class Memory ATE
S-GL-060
Advantest
T5385
Memory ATE
This latest 768-site single-station tester from Advantest is targeted for wafer sort of FLASH and DRAM memory devices. Still limited availablity....
ID# S-GL-061
Advantest T5385ES
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Make Advantest
Model T5385ES
Class Memory ATE
S-GL-061
Advantest
T5385ES
Memory ATE
Designed for engineering use, this smaller version of the T5385 will have limited marketability. Please contact us to verify availability,...
ID# S-GL-062
Advantest T5383
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Make Advantest
Model T5383
Class Memory ATE
S-GL-062
Advantest
T5383
Memory ATE
The T5383 is a 384-site single-station tester designed for DDR SDRAM, SRAM, and FLASH wafer sort. Please contact us to verify availability,...
ID# S-GL-063
Advantest T5377
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Make Advantest
Model T5377
Class Memory ATE
S-GL-063
Advantest
T5377
Memory ATE
This two-station 128-site tester introduced in 2003 gained a large installed base during the memory segment buying in the mid-2000s. Please...
ID# S-GL-064
Advantest T5377S
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Make Advantest
Model T5377S
Class Memory ATE
S-GL-064
Advantest
T5377S
Memory ATE
This single-station version of the 128-site T5377, began the trend of single-station wafer sort solutions in the memory industry. Please contact...
ID# S-GL-065
Advantest T5375
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Make Advantest
Model T5375
Class Memory ATE
S-GL-065
Advantest
T5375
Memory ATE
The first 128-site DDR tester, the T5375 was widely used and still sees some trading today. Please contact us to verify availability,...
ID# S-GL-066
Advantest T5503
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Make Advantest
Model T5503
Class Memory ATE
S-GL-066
Advantest
T5503
Memory ATE
The latest at-speed tester from Advantest, the capabilities reach 3.2Gbps for DDR3/GDDR4, but the installed base and availability is very limited....
ID# S-GL-067
Advantest T5593
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Make Advantest
Model T5593
Class Memory ATE
S-GL-067
Advantest
T5593
Memory ATE
Like most at-speed memory testers, the T5593 is highly capable for testing DDR2, but limited in its customer base and market activity. Please...
ID# S-GL-068
Advantest T5592
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Make Advantest
Model T5592
Class Memory ATE
S-GL-068
Advantest
T5592
Memory ATE
The T5592 is Advantest's DDR at-speed test solution, introduced in 2000 with 32 sites, two stations, and 1.066GHz top DDR speeds. Please contact us...
ID# S-GL-069
Advantest T5588
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Make Advantest
Model T5588
Class Memory ATE
S-GL-069
Advantest
T5588
Memory ATE
Though introduced in 2005, the T5588 is still the memory industry's mainstream core functional test solution, with very few released to the market....
ID# S-GL-070
Advantest T5585
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Make Advantest
Model T5585
Class Memory ATE
S-GL-070
Advantest
T5585
Memory ATE
The T5585 was introduced in 1999 and only boasts 128 sites per station, but is still widely used for core memory testing. Please contact us to...
ID# S-GL-071
Advantest T5773
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Make Advantest
Model T5773
Class Memory ATE
S-GL-071
Advantest
T5773
Memory ATE
The T5773 introduced in 2011 addresses the diverse NAND FLASH memory test market with 768 sites up to 400Mbps. Please contact us to verify...
ID# S-GL-072
Advantest T5782
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Make Advantest
Model T5782
Class Memory ATE
S-GL-072
Advantest
T5782
Memory ATE
Introduced in 2009, the T5782 provided a 256-site solution for the FLASH and MCP test markets. Please contact us to verify availability,...
ID# S-GL-073
Verigy V6000
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Make Verigy
Model V6000
Class Memory ATE
S-GL-073
Verigy
V6000
Memory ATE
A massively parallel FLASH wafer sort solution, the V6000 saw limited adoption due in part to the timing of its introduction in 2009. Please...
ID# S-GL-074
Verigy V5400
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Make Verigy
Model V5400
Class Memory ATE
S-GL-074
Verigy
V5400
Memory ATE
The V5400 was Verigy's most popular FLASH wafer sort solution, but still with very small customer base. Please contact us to verify availability,...
ID# S-GL-075
Agilent V4400
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Make Agilent
Model V4400
Class Memory ATE
S-GL-075
Agilent
V4400
Memory ATE
The V4400 was popular during the growth of the FLASH memory market, but has little market activity today. Please contact us to verify...
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