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Semiconductor Test

Semiconductor Test
Since the company’s founding in 1986, TEAM A.T.E. has focused on automated test equipment. Twenty-eight years later, the company offers expertise in all the major categories of semiconductor test equipment. Our business model is based on efficiently tracking ATE users, buyers, and sellers around the globe, allowing us to hold a relatively high-turn, lean inventory of the most popular equipment. We keep an inventory of attractive parts, which allows our engineering staff to configure a system to meet your requirements. If what you want isn’t immediately available; please let us know your preferred configuration requirements and our global team will do their best to put together your perfect solution.

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View ID# Make Model Class Description
ID# 84365
Semics Opus II
View Details
Make Semics
Model Opus II
Class Wafer Prober
84365
Semics
Opus II
Wafer Prober
Dual Temp: room ~ hot
ID# 86721
Accretech/TSK UF3000
View Details
Make Accretech/TSK
Model UF3000
Class Wafer Prober
86721
Accretech/TSK
UF3000
Wafer Prober
Newly available, contact us!
ID# 88855
Credence SC312
View Details
Make Credence
Model SC312
Class SOC ATE / Mixed Signal
Warranty As-is
Status Skidded
88855
Credence
SC312
SOC ATE / Mixed Signal
TEAM A.T.E. has support SC market for many years. System and parts available, TEAM will work with you to source to your exact requirements.
ID# 88986
Teradyne UltraFLEX Parts
View Details
Make Teradyne
Model UltraFLEX Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status Bagged
88986
Teradyne
UltraFLEX Parts
SOC ATE / Mixed Signal
TEAM buys and sells UltraFlex parts. See some of what's available in the detailed listing.
ID# 88987
Agilent 93000 Parts
View Details
Make Agilent
Model 93000 Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status De-Installed
88987
Agilent
93000 Parts
SOC ATE / Mixed Signal
Agilent -Verigy 93000 and PS 93000 parts available. Contact us for with your needs.
ID# 88988
Teradyne Catalyst Parts
View Details
Make Teradyne
Model Catalyst Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status De-Installed
88988
Teradyne
Catalyst Parts
SOC ATE / Mixed Signal
TEAM has a wide variety of Catalyst parts available. Contact us with your requirements.
ID# 88989
Credence ASL-1000 Parts
View Details
Make Credence
Model ASL-1000 Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status De-Installed
88989
Credence
ASL-1000 Parts
SOC ATE / Mixed Signal
We configure many ASL 1000 systems and generally have a wide variety of parts available. Contact us with your requirements, current availability,...
ID# 88990
Credence Quartet Parts
View Details
Make Credence
Model Quartet Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status De-Installed
88990
Credence
Quartet Parts
SOC ATE / Mixed Signal
TEAM engineers are very experienced with Quartet systems. Let us know your parts requirements.
ID# 88991
Credence SC212 Parts
View Details
Make Credence
Model SC212 Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status De-Installed
88991
Credence
SC212 Parts
SOC ATE / Mixed Signal
TEAM sold and supported many SC212 systems over the years. We still maintain some parts inventory. Let us know if you have parts requirements.
ID# 88992
Credence SC312 Parts
View Details
Make Credence
Model SC312 Parts
Class SOC ATE / Mixed Signal
Warranty Start-up Guarantee
Status De-Installed
88992
Credence
SC312 Parts
SOC ATE / Mixed Signal
TEAM sold and supported many SC312 systems over the years. We still maintain some parts inventory. Let us know if you have parts requirements.
ID# 88996
TSK APM-90 Parts
View Details
Make TSK
Model APM-90 Parts
Class Wafer Prober
Warranty Start-up Guarantee
Status De-Installed
88996
TSK
APM-90 Parts
Wafer Prober
Keep your older APM-90 probers running. TEAM has parts. Let us know your requirements.
ID# 88997
Teradyne P-8XL Parts
View Details
Make Teradyne
Model P-8XL Parts
Class Wafer Prober
Warranty Start-up Guarantee
Status De-Installed
88997
Teradyne
P-8XL Parts
Wafer Prober
Spare parts for P-8XL probers. Let us know your needs.
ID# 90549
Teradyne J750
View Details
Make Teradyne
Model J750
Class SOC ATE / Mixed Signal
Status Operational
90549
Teradyne
J750
SOC ATE / Mixed Signal
Teradyne J750 4M and 16M systems and parts available
ID# 90551
TEL P-8XL
View Details
Make TEL
Model P-8XL
Class Wafer Prober
90551
TEL
P-8XL
Wafer Prober
Complete prober with hinge manipulator. Good condition. Attractive price.
ID# 91103
Teradyne J750
View Details
Make Teradyne
Model J750
Class SOC ATE / Mixed Signal
Warranty As-is
Status Operational
Terms EXW Origin
91103
Teradyne
J750
SOC ATE / Mixed Signal
Full up 512 pin Test Head J750 with 100MHz and 16M LVM. Good working condition. Contact us with your requirements. We can configure.
ID# 91681
Agilent 93000 C400e
View Details
Make Agilent
Model 93000 C400e
Class SOC ATE / Mixed Signal
Status De-Installed
Terms EXW Origin
91681
Agilent
93000 C400e
SOC ATE / Mixed Signal
 
ID# 92205
Verigy V93000 PS
View Details
Make Verigy
Model V93000 PS
Class SOC ATE / Mixed Signal
92205
Verigy
V93000 PS
SOC ATE / Mixed Signal
Large and Small test head systems available. We will configure to your specifications. What do you need?
ID# 92489
Electroglas 4090u
View Details
Make Electroglas
Model 4090u
Class Wafer Prober
Status De-Installed
92489
Electroglas
4090u
Wafer Prober
Automatic Electroglas 4090µ Wafer Prober
ID# 92941
Credence ASL-x
View Details
Make Credence
Model ASL-x
Class SOC ATE / Mixed Signal
92941
Credence
ASL-x
SOC ATE / Mixed Signal
Credence ASL-x Tester
ID# 92963
TEL P12XLn+
View Details
Make TEL
Model P12-XLn+
Class Wafer Prober
92963
TEL
P12-XLn+
Wafer Prober
Available 2019 (includes tri-temp chuck)
ID# 93162
Delta Eclipse
View Details
Make Delta
Model Eclipse
Class Chip Handler
93162
Delta
Eclipse
Chip Handler
Delta Design (Cohu) Eclipse Handler
ID# 93284
Eagle ETS-364
View Details
Make Eagle
Model ETS-364
Class SOC ATE / Mixed Signal
93284
Eagle
ETS-364
SOC ATE / Mixed Signal
Eagle Test ETS-364 complete functional test system for sale
ID# 93287
NexTest Maverick
View Details
Make NexTest
Model Maverick
Class SOC ATE / Mixed Signal
93287
NexTest
Maverick
SOC ATE / Mixed Signal
VLSI Test System
ID# 93346
Accretech/TSK UF3000
View Details
Make Accretech/TSK
Model UF3000
Class Wafer Prober
93346
Accretech/TSK
UF3000
Wafer Prober
To work with 440 mm probe card preferred
ID# 93454
Electroglas 2001X
View Details
Make Electroglas
Model 2001X
Class Wafer Prober
93454
Electroglas
2001X
Wafer Prober
Several systems available
ID# 93458
Multitest 8704
View Details
Make Multitest
Model 8704
Class Chip Handler
93458
Multitest
8704
Chip Handler
for package SSOP28
ID# 93476
Seiko-Epson NS6040
View Details
Make Seiko-Epson
Model NS6040
Class Chip Handler
93476
Seiko-Epson
NS6040
Chip Handler
Seiko Epson NS6040 Handler
ID# 93492
Teradyne J750ex
View Details
Make Teradyne
Model J750ex
Class SOC ATE / Mixed Signal
93492
Teradyne
J750ex
SOC ATE / Mixed Signal
can custom configure
ID# 93648
Teradyne microFLEX Parts
View Details
Make Teradyne
Model microFLEX
Class SOC ATE / Mixed Signal
93648
Teradyne
microFLEX
SOC ATE / Mixed Signal
HSD-200, BBAC, DC-30
ID# 93751
Teradyne J750
View Details
Make Teradyne
Model J750
Class SOC ATE / Mixed Signal
Status Operational
93751
Teradyne
J750
SOC ATE / Mixed Signal
Teradyne J750 + TSK UF200A/AL
ID# 93769
Teradyne UltraFLEX
View Details
Make Teradyne
Model UltraFLEX
Class SOC ATE / Mixed Signal
93769
Teradyne
UltraFLEX
SOC ATE / Mixed Signal
UP800 channel boards
ID# 94025
Verigy V93000 PS
View Details
Make Credence
Model V93000 PS
Class SOC ATE / Mixed Signal
Warranty 30-day Exchange
Status Operational
Terms EXW Origin
94025
Credence
V93000 PS
SOC ATE / Mixed Signal
Priced to sell.
ID# 94816
NI PXle
View Details
Make NI
Model PXle
94816
NI
PXle
RF test equipment used for 5G and WiFi testing
ID# 95189
HP 4070 Parts
View Details
Make HP
Model 4070
Class Parametric Test
95189
HP
4070
Parametric Test
HP 4070 parametric tester parts needed
ID# 95424
Teradyne ultraFLEXx Epsilon RF
View Details
Make Teradyne
Model ultraFLEXx Epsilon RF
Class SOC ATE / Mixed Signal
95424
Teradyne
ultraFLEXx Epsilon RF
SOC ATE / Mixed Signal
Teradyne ultraFLEXx Epsilon RF
ID# S-GL-001
Teradyne UltraFLEX
View Details
Make Teradyne
Model UltraFLEX
Class SOC ATE / Mixed Signal
S-GL-001
Teradyne
UltraFLEX
SOC ATE / Mixed Signal
The UltraFlex is Teradyne's current flagship SOC tester, with broad instrumentation ranging from RF to high-speed digital. Please contact us to...
ID# S-GL-002
Teradyne FLEX
View Details
Make Teradyne
Model FLEX
Class SOC ATE / Mixed Signal
S-GL-002
Teradyne
FLEX
SOC ATE / Mixed Signal
The first Flex model was released in 2002 for the popular platform, the FLEX is still widely used today for power management and automotive devices...
ID# S-GL-003
Teradyne microFLEX
View Details
Make Teradyne
Model microFLEX
Class SOC ATE / Mixed Signal
S-GL-003
Teradyne
microFLEX
SOC ATE / Mixed Signal
The compact 12-slot member of the FLEX family, the microFLEX is still popular for many low-cost, mixed signal device applications. Please contact...
ID# S-GL-004
Teradyne J750
View Details
Make Teradyne
Model J750
Class SOC ATE / Mixed Signal
S-GL-004
Teradyne
J750
SOC ATE / Mixed Signal
The simple yet innovative design of the J750 makes this the most widely used test platform in the market today. TEAM is always looking for these...
ID# S-GL-005
Teradyne J750Ex
View Details
Make Teradyne
Model J750Ex
Class SOC ATE / Mixed Signal
S-GL-005
Teradyne
J750Ex
SOC ATE / Mixed Signal
The J750Ex extends the capabilities of the first-generation J750 to include higher speed and density instrumentation. TEAM is always looking for...
ID# S-GL-006
Teradyne IP750
View Details
Make Teradyne
Model IP750
Class SOC ATE / Mixed Signal
S-GL-006
Teradyne
IP750
SOC ATE / Mixed Signal
The popular IP750 leverages the innovative architecture of the J750 into the image sensor test arena. Please contact us to verify availability,...
ID# S-GL-007
Teradyne IP750EMP
View Details
Make Teradyne
Model IP750EMP
Class SOC ATE / Mixed Signal
S-GL-007
Teradyne
IP750EMP
SOC ATE / Mixed Signal
The IP750EMP is the second generation image sensor tester from Teradyne, offering faster capture and processing of image sensor test data. Please...
ID# S-GL-008
Teradyne IP750Ex
View Details
Make Teradyne
Model IP750Ex
Class SOC ATE / Mixed Signal
S-GL-008
Teradyne
IP750Ex
SOC ATE / Mixed Signal
The IP750Ex is the latest image sensor test solution from Teradyne, offering the highest throughput and channel density of the family. Please...
ID# S-GL-009
Advantest V93000
View Details
Make Advantest
Model V93000
Class SOC ATE / Mixed Signal
S-GL-009
Advantest
V93000
SOC ATE / Mixed Signal
This original release for the "93K" platform established a broad footprint in the marketplace. These early, lower density systems can represent...
ID# S-GL-010
Advantest V93000 PinScale
View Details
Make Advantest
Model V93000 PinScale
Class SOC ATE / Mixed Signal
S-GL-010
Advantest
V93000 PinScale
SOC ATE / Mixed Signal
The second generation PinScale 93K offering higher density channels and innovative per-pin feature licensing capabilities. TEAM has been moving a...
ID# S-GL-011
Advantest V93000 SmartScale
View Details
Make Advantest
Model V93000 SmartScale
Class SOC ATE / Mixed Signal
S-GL-011
Advantest
V93000 SmartScale
SOC ATE / Mixed Signal
The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Still very limited on the used...
ID# S-GL-012
Advantest T2000
View Details
Make Advantest
Model T2000
Class SOC ATE / Mixed Signal
S-GL-012
Advantest
T2000
SOC ATE / Mixed Signal
Advantest's flagship SOC platform built strong marketshare in microprocessors, but limited in installed base elsewhere. Configurations are key....
ID# S-GL-013
Eagle ETS-300
View Details
Make Eagle
Model ETS-300
Class SOC ATE / Mixed Signal
S-GL-013
Eagle
ETS-300
SOC ATE / Mixed Signal
The "big-A (Analog), little-D" (Digital) companion to the ETS-364, the ETS-300 has a more limited user base. Like all mixed signal, your...
ID# S-GL-014
Eagle ETS-364
View Details
Make Eagle
Model ETS-364
Class SOC ATE / Mixed Signal
S-GL-014
Eagle
ETS-364
SOC ATE / Mixed Signal
The ETS-364 has extended beyond its narrow customer base into broader segments and geographies. Like all mixed signal, your configuration...
ID# S-GL-015
Eagle ETS-364B
View Details
Make Eagle
Model ETS-364B
Class SOC ATE / Mixed Signal
S-GL-015
Eagle
ETS-364B
SOC ATE / Mixed Signal
This "B" version of the ETS-364 has a smaller cabinet and smaller footprint, but cannot support RF options. Like all mixed signal, your...
ID# S-GL-016
LTX-Credence Diamond X
View Details
Make LTX-Credence
Model Diamond X
Class SOC ATE / Mixed Signal
S-GL-016
LTX-Credence
Diamond X
SOC ATE / Mixed Signal
The Diamond X extends the Diamond platform with larger configurations, but has a limited installed base. Please contact us to verify availability,...
ID# S-GL-017
LTX-Credence X-Series
View Details
Make LTX-Credence
Model X-Series
Class SOC ATE / Mixed Signal
S-GL-017
LTX-Credence
X-Series
SOC ATE / Mixed Signal
The X-Series platform provides a low-cost solution for analog and mixed-signal devices, but has a limited user base. Please contact us to verify...
ID# S-GL-018
Credence D-10
View Details
Make Credence
Model D-10
Class SOC ATE / Mixed Signal
S-GL-018
Credence
D-10
SOC ATE / Mixed Signal
An interesting competitive alternative to the popular J750, the Diamond 10 or D-10 is constrained to certain market segments, but we do see...
ID# S-GL-019
Credence ASL1000
View Details
Make Credence
Model ASL1000
Class SOC ATE / Mixed Signal
S-GL-019
Credence
ASL1000
SOC ATE / Mixed Signal
These small systems were used in great numbers for low level MS devices. TEAM can offer configured ASL1000s to order. Please contact us to verify...
ID# S-GL-020
Credence ASL3000
View Details
Make Credence
Model ASL3000
Class SOC ATE / Mixed Signal
S-GL-020
Credence
ASL3000
SOC ATE / Mixed Signal
The ASL3000 was sold in limited numbers, but extended the ASL1000 to include higher end analog and RF instrumentation. Please contact us to verify...
ID# S-GL-021
NexTest Maverick
View Details
Make NexTest
Model Maverick
Class SOC ATE / Mixed Signal
S-GL-021
NexTest
Maverick
SOC ATE / Mixed Signal
First shipped in 1998, the Maverick still sees trading activity today for small to medium sized FLASH and SOC devices. Please contact us to verify...
ID# S-GL-022
NexTest Magnum
View Details
Make NexTest
Model Magnum
Class Memory ATE
S-GL-022
NexTest
Magnum
Memory ATE
The big brother of the Maverick, the Magnum has a more limited installed base due to its higher pincount focus and shift in the FLASH test market....
ID# S-GL-023
NPTest Sapphire
View Details
Make NPTest
Model Sapphire
Class SOC ATE / Mixed Signal
S-GL-023
NPTest
Sapphire
SOC ATE / Mixed Signal
Generally confined to microprocessor device applications, the Sapphire has limited secondary market activity. Please contact us to verify...
ID# S-GL-024
Accretech UF3000Ex
View Details
Make Accretech
Model UF3000Ex
Class Wafer Prober
S-GL-024
Accretech
UF3000Ex
Wafer Prober
The UF3000Ex is the latest 300mm prober offering for the Accretech platform, providing improved throughput and alignment performance. Please...
ID# S-GL-025
Accretech UF2000
View Details
Make Accretech
Model UF2000
Class Wafer Prober
S-GL-025
Accretech
UF2000
Wafer Prober
Accretech's high-end 200mm prober, the UF2000 does not have the broad acceptance like the orignal UF200 platform. Please contact us to verify...
ID# S-GL-026
Accretech UF3000
View Details
Make Accretech
Model UF3000
Class Wafer Prober
S-GL-026
Accretech
UF3000
Wafer Prober
The UF3000 is Accretech's broadly popular 300mm workhorse prober solution with a very active secondary market. Please contact us to verify...
ID# S-GL-027
TSK UF200
View Details
Make TSK
Model UF200
Class Wafer Prober
S-GL-027
TSK
UF200
Wafer Prober
The UF200 is the successful original 200mm wafer prober solution from TSK (now Accretech). Please contact us to verify availability,...
ID# S-GL-028
TSK UF200A
View Details
Make TSK
Model UF200A
Class Wafer Prober
S-GL-028
TSK
UF200A
Wafer Prober
The UF200A is used for processing very thin wafers and with wafer-level burn-in systems. Please contact us to verify availability, configuration...
ID# S-GL-029
TSK UF200S
View Details
Make TSK
Model UF200S
Class Wafer Prober
S-GL-029
TSK
UF200S
Wafer Prober
Providing high-rigidity for finer-pitched, dense probe memory devices, the UF200S extends the popular UF200 family. Please contact us to verify...
ID# S-GL-030
TSK UF200SA
View Details
Make TSK
Model UF200SA
Class Wafer Prober
S-GL-030
TSK
UF200SA
Wafer Prober
The UF200SA combines the best of the "A" and "S" models, and is about equally prevalent in the market. Please contact us to verify availability,...
ID# S-GL-031
TSK UF200F
View Details
Make TSK
Model UF200F
Class Wafer Prober
S-GL-031
TSK
UF200F
Wafer Prober
The UF200F is the least popular among the various models of the UF200 family, due to its limited and specialized advantages. Please contact us to...
ID# S-GL-032
TSK UF190B
View Details
Make TSK
Model UF190B
Class Wafer Prober
S-GL-032
TSK
UF190B
Wafer Prober
The UF-190B provides a simple, low-cost 200mm probe solution. Please contact us to verify availability, configuration requirements and pricing.
ID# S-GL-033
TEL Precio
View Details
Make TEL
Model Precio
Class Wafer Prober
S-GL-033
TEL
Precio
Wafer Prober
The Precio is TEL's current flagship high-performance 300mm wafer prober, touting 50% improvement in wafer change time. Limited on used market....
ID# S-GL-034
TEL P12-XLn+
View Details
Make TEL
Model P12-XLn+
Class Wafer Prober
S-GL-034
TEL
P12-XLn+
Wafer Prober
One of the more popular extensions of the P12-XL family, the "n" and "n+" improve overall alignment accuracy for smaller devices. Please contact...
ID# S-GL-035
TEL P12-XL
View Details
Make TEL
Model P12-XL
Class Wafer Prober
S-GL-035
TEL
P12-XL
Wafer Prober
The P12-XL is the most popular and broadly used of the 300mm P12 prober family and typically available in the market. Please contact us to verify...
ID# S-GL-036
TEL P8-XL
View Details
Make TEL
Model P8-XL
Class Wafer Prober
S-GL-036
TEL
P8-XL
Wafer Prober
This widely used 200mm wafer prober from TEL is still actively traded today, TEAM can provide options and upgrades with refurbed probers. Please...
ID# S-GL-037
Delta MATRiX
View Details
Make Delta
Model MATRiX
Class Chip Handler
S-GL-037
Delta
MATRiX
Chip Handler
Delta's faster pick-and-place handler, the MATRiX offers up to 16,000 UPH for packages ranging from 2mm to 51mm. Limited availability. Please...
ID# S-GL-038
Delta EDGE
View Details
Make Delta
Model EDGE
Class Chip Handler
S-GL-038
Delta
EDGE
Chip Handler
This pick-and-place handler from Delta is widely used in all segments for multi-site SOC package testing. Please contact us to verify...
ID# S-GL-039
Delta Summit
View Details
Make Delta
Model Summit
Class Chip Handler
S-GL-039
Delta
Summit
Chip Handler
The Summit's specialized high power device and cooling capability limits its market use and activity. Please contact us to verify availability,...
ID# S-GL-040
Delta Castle
View Details
Make Delta
Model Castle
Class Chip Handler
S-GL-040
Delta
Castle
Chip Handler
The lower relative throughput of this once leading handler limits its demand, but results in some low cost handler options for lower volume...
ID# S-GL-041
Multitest M9918
View Details
Make Multitest
Model M9918
Class Chip Handler
S-GL-041
Multitest
M9918
Chip Handler
This tri-temp gravity handler introduced in 2001 features octal site parallel testing at up to 28,000 units per hour throughput. Device type is...
ID# S-GL-042
Multitest M9928
View Details
Make Multitest
Model M9928
Class Chip Handler
S-GL-042
Multitest
M9928
Chip Handler
The M9928 along with its predecessor, the M9918, are both broadly used and have over 1000 units installed. Device type is key. Please contact us...
ID# S-GL-043
Multitest M9320
View Details
Make Multitest
Model M9320
Class Chip Handler
S-GL-043
Multitest
M9320
Chip Handler
The last model in the M93xx gravity feed platform, the M9320 is a very flexible and fast handler. Still very limited availability. Please contact...
ID# S-GL-044
Multitest M9308
View Details
Make Multitest
Model M9308
Class Chip Handler
S-GL-044
Multitest
M9308
Chip Handler
A very popular handler following its introduction in 1995, the M9308's lifecycle limits and device types are the key when looking in the used...
ID# S-GL-045
Advantest M6242
View Details
Make Advantest
Model M6242
Class Chip Handler
S-GL-045
Advantest
M6242
Chip Handler
The M6242 is Advantest's highest throughput memory handler at 42,200 UPH and paired with the T5503 tester. Please contact us to verify...
ID# S-GL-046
Advantest M6300
View Details
Make Advantest
Model M6300
Class Chip Handler
S-GL-046
Advantest
M6300
Chip Handler
The M6300 was introduced in 2005 and typically pairs with the 256 sites of a T5588 test station. Please contact us to verify availability,...
ID# S-GL-047
Advantest M6542AD
View Details
Make Advantest
Model M6542AD
Class Chip Handler
S-GL-047
Advantest
M6542AD
Chip Handler
The M6542AD is still a popular memory handler, typically sold with the T5593 or T5377 testers. Please contact us to verify availability,...
ID# S-GL-048
Rasco SO2000
View Details
Make Rasco
Model SO2000
Class Chip Handler
S-GL-048
Rasco
SO2000
Chip Handler
This smaller footprint gravity feed handler is popular for smaller devices and related input and output mechanisms. Please contact us to verify...
ID# S-GL-049
Seiko-Epson NS-8000
View Details
Make Seiko-Epson
Model NS-8000
Class Chip Handler
S-GL-049
Seiko-Epson
NS-8000
Chip Handler
The NS-8000 series is the latest model in this popular series from Seiko Epson offering high throughput and wide range of options. Very limited...
ID# S-GL-050
Seiko-Epson NS-7000
View Details
Make Seiko-Epson
Model NS-7000
Class Chip Handler
S-GL-050
Seiko-Epson
NS-7000
Chip Handler
The NS-7000 series offers several models at varying throughputs, input/output modules, and site counts. Please contact us to verify availability,...
ID# S-GL-051
Agilent 4083A
View Details
Make Agilent
Model 4083A
Class Parametric Test
S-GL-051
Agilent
4083A
Parametric Test
The 4083A brings RF VNA measurement capability up to 20GHz to the 4080 family. Limited availabiltiy on the used market. Please contact us to...
ID# S-GL-052
Agilent 4082F
View Details
Make Agilent
Model 4082F
Class Parametric Test
S-GL-052
Agilent
4082F
Parametric Test
Providing special high-voltage instrumetation for FLASH devices, the 4082F further extends the 4080 family. Limited availabiltiy on the used...
ID# S-GL-053
Agilent 4082A
View Details
Make Agilent
Model 4082A
Class Parametric Test
S-GL-053
Agilent
4082A
Parametric Test
The 4082A is the mainstream model of the 4080 series, providing both ultra-low-current and high-frequency matrix cards. Please contact us to...
ID# S-GL-054
Agilent 4073B
View Details
Make Agilent
Model 4073B
Class Parametric Test
S-GL-054
Agilent
4073B
Parametric Test
Similar to the 4073A, the 4073B had limited penetration into the broader markets. Please contact us to verify availability, configuration...
ID# S-GL-055
Agilent 4073A
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Make Agilent
Model 4073A
Class Parametric Test
S-GL-055
Agilent
4073A
Parametric Test
The market did not seem to see the value in the added capability of the 4073A, limiting its installed base and market activity. Please contact us...
ID# S-GL-056
Agilent 4072B
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Make Agilent
Model 4072B
Class Parametric Test
S-GL-056
Agilent
4072B
Parametric Test
The high-speed instrumentation and subsequent high throughput established a broad installed base for the 4072B. Please contact us to verify...
ID# S-GL-057
HP 4072A
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Make HP
Model 4072A
Class Parametric Test
S-GL-057
HP
4072A
Parametric Test
The 4072A is a popular member of the 4070 family, but not as widely used as the 4072B. Please contact us to verify availability, configuration...
ID# S-GL-058
HP 4071A
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Make HP
Model 4071A
Class Parametric Test
S-GL-058
HP
4071A
Parametric Test
This initial model of the 4070 series from HP (now Agilent), did not gain much traction and therefore has limited market activity. Please contact...
ID# S-GL-059
HP 4062UX
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Make HP
Model 4062UX
Class Parametric Test
S-GL-059
HP
4062UX
Parametric Test
This popular parametric tester dominated the market in the 1990s, but sees limited market activity today. For lower level testing, could be a...
ID# S-GL-060
Advantest T5385
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Make Advantest
Model T5385
Class Memory ATE
S-GL-060
Advantest
T5385
Memory ATE
This latest 768-site single-station tester from Advantest is targeted for wafer sort of FLASH and DRAM memory devices. Still limited availablity....
ID# S-GL-061
Advantest T5385ES
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Make Advantest
Model T5385ES
Class Memory ATE
S-GL-061
Advantest
T5385ES
Memory ATE
Designed for engineering use, this smaller version of the T5385 will have limited marketability. Please contact us to verify availability,...
ID# S-GL-062
Advantest T5383
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Make Advantest
Model T5383
Class Memory ATE
S-GL-062
Advantest
T5383
Memory ATE
The T5383 is a 384-site single-station tester designed for DDR SDRAM, SRAM, and FLASH wafer sort. Please contact us to verify availability,...
ID# S-GL-063
Advantest T5377
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Make Advantest
Model T5377
Class Memory ATE
S-GL-063
Advantest
T5377
Memory ATE
This two-station 128-site tester introduced in 2003 gained a large installed base during the memory segment buying in the mid-2000s. Please...
ID# S-GL-064
Advantest T5377S
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Make Advantest
Model T5377S
Class Memory ATE
S-GL-064
Advantest
T5377S
Memory ATE
This single-station version of the 128-site T5377, began the trend of single-station wafer sort solutions in the memory industry. Please contact...
ID# S-GL-065
Advantest T5375
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Make Advantest
Model T5375
Class Memory ATE
S-GL-065
Advantest
T5375
Memory ATE
The first 128-site DDR tester, the T5375 was widely used and still sees some trading today. Please contact us to verify availability,...
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