The evolution of the 3070 series test systems started at Hewlett Packard (HP) back in 1989. The first three generations of systems were designed and built under the HP banner. The Series I test system was introduced in 1989, the 3070 Series II model was introduced in 1994, and then the 3070 Series 3 in 1998. When HP spun off their test and measurement business in 2000 the new company became Agilent Technologies. In 2003 Agilent upgraded some hardware components of the 3070 Series 3 and added a number of key new software features. In 2007 Agilent introduced the Medalist i3070, and in 2009 the current production model was introduced as the Agilent Medalist i3070 Series 5. Agilent will spin-off their test and measurement business in August of 2014 and the new business will be named Keysight Technologies.
There are 8 types of pin boards available for the 3070 Series II and later families of test systems. The pin boards utilized in the 3070 family of testers use one of the following multiplex ratios 1:1, 2:9 or 2:18.
- DD6 Hybrid Plus Pin Board (6.25 MHz) with 16 driver/sensors per board, muxed to 144 nodes
- DD12 Hybrid Plus Pin Board (12.5 MHz) with 16 driver/sensors per board, muxed to 144 nodes
- DD20 Hybrid Plus Pin Board (20 MHz) with 16 driver/sensors per board, muxed to 144 nodes
- DD6 Hybrid32 Pin Board (6.25 MHz) with 32 driver/sensors per board, muxed to 144 nodes
- DD12 Hybrid32 Pin Board (12.5 MHz) with 32 driver/sensors per board, muxed to 144 nodes
- DD20 Hybrid32 Pin Board (20 MHz) with 32 driver/sensors per board, muxed to 144 nodes
- Un-Muxed Hybrid 144
- Analog Plus Pin Board 144 nodes
TEAM A.T.E. has over 20 years??? experience working with Agilent 3070 Series test systems. Whether you need to purchase, rent, sell, reconfigure, repair or calibrate a tester, we are a one stop shop. Our engineers have been factory trained by the O.E.M. and we utilize the exact same manufacturing processes to ensure system reliability and quality.
Agilent 3070 Series 3, Medalist i3070 & Medalist i3070 Series 5 Test Systems
There are essentially three 3070 testhead configurations and three models per configuration regardless of whether the system is a Series 3 or 5 test system.
Low Cost Combinational Test Systems (most prevalent models in the market)
The 3273 is a single module system using DD6 Hybrid cards with a maximum pin count of 1,296 nodes
The 3173 is a two module system using DD6 Hybrid cards with a maximum pin count of 2,592 nodes
The 3073 is a 4 module system using DD6 Hybrid cards with a maximum pin count of 5,184 nodes
High Performance Combinational Test Systems (typically used by Mil/Aero companies)
The 3275 is a single module system using DD20 Hybrid cards with a maximum pin count of 1,296 nodes
The 3175 is a two module system using DD20 Hybrid cards with a maximum pin count of 2,592 nodes
The 3075 is a 4 module system using DD20 Hybrid cards with a maximum pin count of 5,184 nodes
Process Test Systems (not widely used)
The 3272 is a single module system using Analog Plus cards with a maximum pin count of 1,296 nodes
The 3172 is a two module system using Analog Plus cards with a maximum pin count of 2,592 nodes
The 3072 is a 4 module system using Analog Plus cards with a maximum pin count of 5,184 nodes
Whether your system has 1, 2, 3 or 4 modules activated, each module will need to have a Control XT/XTP or XTPA card, an ASRU card rev. C, D or N and an HP power supply (not required for the 3X72 models) in addition to pin boards.
