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Semiconductor Test
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Since the company’s founding in 1986, TEAM A.T.E. has focused on automated test equipment. Twenty-eight years later, the company offers expertise in all the major categories of semiconductor test equipment. Our business model is based on efficiently tracking ATE users, buyers, and sellers around the globe, allowing us to hold a relatively high-turn, lean inventory of the most popular equipment. We keep an inventory of attractive parts, which allows our engineering staff to configure a system to meet your requirements. If what you want isn’t immediately available; please let us know your preferred configuration requirements and our global team will do their best to put together your perfect solution.
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84365
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Semics
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Opus II
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Wafer Prober
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Dual Temp: room ~ hot
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86721
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Accretech/TSK
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UF3000
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Wafer Prober
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Newly available, contact us!
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88855
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Credence
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SC312
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SOC ATE / Mixed Signal
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TEAM A.T.E. has support SC market for many years. System and parts available, TEAM will work with you to source to your exact requirements.
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88986
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Teradyne
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UltraFLEX Parts
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SOC ATE / Mixed Signal
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TEAM buys and sells UltraFlex parts. See some of what's available in the detailed listing.
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88987
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Agilent
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93000 Parts
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SOC ATE / Mixed Signal
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Agilent -Verigy 93000 and PS 93000 parts available. Contact us for with your needs.
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88988
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Teradyne
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Catalyst Parts
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SOC ATE / Mixed Signal
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TEAM has a wide variety of Catalyst parts available. Contact us with your requirements.
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88989
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Credence
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ASL-1000 Parts
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SOC ATE / Mixed Signal
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We configure many ASL 1000 systems and generally have a wide variety of parts available. Contact us with your requirements, current availability,...
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88990
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Credence
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Quartet Parts
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SOC ATE / Mixed Signal
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TEAM engineers are very experienced with Quartet systems. Let us know your parts requirements.
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88991
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Credence
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SC212 Parts
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SOC ATE / Mixed Signal
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TEAM sold and supported many SC212 systems over the years. We still maintain some parts inventory. Let us know if you have parts requirements.
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88992
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Credence
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SC312 Parts
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SOC ATE / Mixed Signal
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TEAM sold and supported many SC312 systems over the years. We still maintain some parts inventory. Let us know if you have parts requirements.
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88996
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TSK
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APM-90 Parts
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Wafer Prober
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Keep your older APM-90 probers running. TEAM has parts. Let us know your requirements.
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88997
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Teradyne
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P-8XL Parts
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Wafer Prober
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Spare parts for P-8XL probers. Let us know your needs.
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90549
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Teradyne
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J750
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SOC ATE / Mixed Signal
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Teradyne J750 4M and 16M systems and parts available
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90551
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TEL
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P-8XL
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Wafer Prober
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Complete prober with hinge manipulator. Good condition. Attractive price.
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91103
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Teradyne
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J750
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SOC ATE / Mixed Signal
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Full up 512 pin Test Head J750 with 100MHz and 16M LVM. Good working condition. Contact us with your requirements. We can configure.
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91681
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Agilent
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93000 C400e
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SOC ATE / Mixed Signal
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92205
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Verigy
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V93000 PS
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SOC ATE / Mixed Signal
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Large and Small test head systems available. We will configure to your specifications. What do you need?
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92489
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Electroglas
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4090u
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Wafer Prober
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Automatic Electroglas 4090µ Wafer Prober
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92941
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Credence
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ASL-x
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SOC ATE / Mixed Signal
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Credence ASL-x Tester
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92963
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TEL
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P12-XLn+
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Wafer Prober
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Available 2019 (includes tri-temp chuck)
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93162
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Delta
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Eclipse
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Chip Handler
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Delta Design (Cohu) Eclipse Handler
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93284
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Eagle
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ETS-364
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SOC ATE / Mixed Signal
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Eagle Test ETS-364 complete functional test system for sale
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93287
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NexTest
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Maverick
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SOC ATE / Mixed Signal
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VLSI Test System
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93346
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Accretech/TSK
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UF3000
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Wafer Prober
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To work with 440 mm probe card preferred
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93454
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Electroglas
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2001X
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Wafer Prober
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Several systems available
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93458
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Multitest
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8704
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Chip Handler
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for package SSOP28
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93476
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Seiko-Epson
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NS6040
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Chip Handler
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Seiko Epson NS6040 Handler
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93492
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Teradyne
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J750ex
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SOC ATE / Mixed Signal
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can custom configure
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93648
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Teradyne
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microFLEX
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SOC ATE / Mixed Signal
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HSD-200, BBAC, DC-30
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93751
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Teradyne
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J750
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SOC ATE / Mixed Signal
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Teradyne J750 + TSK UF200A/AL
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93769
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Teradyne
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UltraFLEX
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SOC ATE / Mixed Signal
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UP800 channel boards
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94025
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Credence
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V93000 PS
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SOC ATE / Mixed Signal
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Priced to sell.
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94816
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NI
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PXle
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RF test equipment used for 5G and WiFi testing
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95189
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HP
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4070
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Parametric Test
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HP 4070 parametric tester parts needed
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95424
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Teradyne
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ultraFLEXx Epsilon RF
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SOC ATE / Mixed Signal
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Teradyne ultraFLEXx Epsilon RF
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S-GL-001
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Teradyne
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UltraFLEX
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SOC ATE / Mixed Signal
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The UltraFlex is Teradyne's current flagship SOC tester, with broad instrumentation ranging from RF to high-speed digital. Please contact us to...
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S-GL-002
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Teradyne
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FLEX
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SOC ATE / Mixed Signal
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The first Flex model was released in 2002 for the popular platform, the FLEX is still widely used today for power management and automotive devices...
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S-GL-003
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Teradyne
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microFLEX
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SOC ATE / Mixed Signal
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The compact 12-slot member of the FLEX family, the microFLEX is still popular for many low-cost, mixed signal device applications. Please contact...
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S-GL-004
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Teradyne
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J750
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SOC ATE / Mixed Signal
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The simple yet innovative design of the J750 makes this the most widely used test platform in the market today. TEAM is always looking for these...
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S-GL-005
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Teradyne
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J750Ex
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SOC ATE / Mixed Signal
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The J750Ex extends the capabilities of the first-generation J750 to include higher speed and density instrumentation. TEAM is always looking for...
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S-GL-006
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Teradyne
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IP750
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SOC ATE / Mixed Signal
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The popular IP750 leverages the innovative architecture of the J750 into the image sensor test arena. Please contact us to verify availability,...
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S-GL-007
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Teradyne
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IP750EMP
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SOC ATE / Mixed Signal
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The IP750EMP is the second generation image sensor tester from Teradyne, offering faster capture and processing of image sensor test data. Please...
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S-GL-008
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Teradyne
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IP750Ex
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SOC ATE / Mixed Signal
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The IP750Ex is the latest image sensor test solution from Teradyne, offering the highest throughput and channel density of the family. Please...
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S-GL-009
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Advantest
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V93000
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SOC ATE / Mixed Signal
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This original release for the "93K" platform established a broad footprint in the marketplace. These early, lower density systems can represent...
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S-GL-010
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Advantest
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V93000 PinScale
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SOC ATE / Mixed Signal
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The second generation PinScale 93K offering higher density channels and innovative per-pin feature licensing capabilities. TEAM has been moving a...
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S-GL-011
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Advantest
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V93000 SmartScale
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SOC ATE / Mixed Signal
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The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Still very limited on the used...
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S-GL-012
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Advantest
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T2000
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SOC ATE / Mixed Signal
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Advantest's flagship SOC platform built strong marketshare in microprocessors, but limited in installed base elsewhere. Configurations are key....
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S-GL-013
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Eagle
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ETS-300
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SOC ATE / Mixed Signal
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The "big-A (Analog), little-D" (Digital) companion to the ETS-364, the ETS-300 has a more limited user base. Like all mixed signal, your...
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S-GL-014
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Eagle
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ETS-364
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SOC ATE / Mixed Signal
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The ETS-364 has extended beyond its narrow customer base into broader segments and geographies. Like all mixed signal, your configuration...
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S-GL-015
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Eagle
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ETS-364B
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SOC ATE / Mixed Signal
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This "B" version of the ETS-364 has a smaller cabinet and smaller footprint, but cannot support RF options. Like all mixed signal, your...
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S-GL-016
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LTX-Credence
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Diamond X
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SOC ATE / Mixed Signal
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The Diamond X extends the Diamond platform with larger configurations, but has a limited installed base. Please contact us to verify availability,...
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S-GL-017
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LTX-Credence
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X-Series
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SOC ATE / Mixed Signal
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The X-Series platform provides a low-cost solution for analog and mixed-signal devices, but has a limited user base. Please contact us to verify...
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S-GL-018
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Credence
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D-10
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SOC ATE / Mixed Signal
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An interesting competitive alternative to the popular J750, the Diamond 10 or D-10 is constrained to certain market segments, but we do see...
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S-GL-019
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Credence
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ASL1000
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SOC ATE / Mixed Signal
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These small systems were used in great numbers for low level MS devices. TEAM can offer configured ASL1000s to order. Please contact us to verify...
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S-GL-020
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Credence
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ASL3000
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SOC ATE / Mixed Signal
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The ASL3000 was sold in limited numbers, but extended the ASL1000 to include higher end analog and RF instrumentation. Please contact us to verify...
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S-GL-021
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NexTest
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Maverick
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SOC ATE / Mixed Signal
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First shipped in 1998, the Maverick still sees trading activity today for small to medium sized FLASH and SOC devices. Please contact us to verify...
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S-GL-022
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NexTest
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Magnum
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Memory ATE
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The big brother of the Maverick, the Magnum has a more limited installed base due to its higher pincount focus and shift in the FLASH test market....
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S-GL-023
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NPTest
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Sapphire
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SOC ATE / Mixed Signal
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Generally confined to microprocessor device applications, the Sapphire has limited secondary market activity. Please contact us to verify...
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S-GL-024
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Accretech
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UF3000Ex
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Wafer Prober
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The UF3000Ex is the latest 300mm prober offering for the Accretech platform, providing improved throughput and alignment performance. Please...
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S-GL-025
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Accretech
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UF2000
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Wafer Prober
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Accretech's high-end 200mm prober, the UF2000 does not have the broad acceptance like the orignal UF200 platform. Please contact us to verify...
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S-GL-026
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Accretech
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UF3000
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Wafer Prober
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The UF3000 is Accretech's broadly popular 300mm workhorse prober solution with a very active secondary market. Please contact us to verify...
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S-GL-027
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TSK
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UF200
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Wafer Prober
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The UF200 is the successful original 200mm wafer prober solution from TSK (now Accretech). Please contact us to verify availability,...
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S-GL-028
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TSK
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UF200A
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Wafer Prober
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The UF200A is used for processing very thin wafers and with wafer-level burn-in systems. Please contact us to verify availability, configuration...
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S-GL-029
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TSK
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UF200S
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Wafer Prober
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Providing high-rigidity for finer-pitched, dense probe memory devices, the UF200S extends the popular UF200 family. Please contact us to verify...
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S-GL-030
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TSK
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UF200SA
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Wafer Prober
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The UF200SA combines the best of the "A" and "S" models, and is about equally prevalent in the market. Please contact us to verify availability,...
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S-GL-031
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TSK
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UF200F
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Wafer Prober
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The UF200F is the least popular among the various models of the UF200 family, due to its limited and specialized advantages. Please contact us to...
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S-GL-032
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TSK
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UF190B
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Wafer Prober
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The UF-190B provides a simple, low-cost 200mm probe solution. Please contact us to verify availability, configuration requirements and pricing.
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S-GL-033
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TEL
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Precio
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Wafer Prober
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The Precio is TEL's current flagship high-performance 300mm wafer prober, touting 50% improvement in wafer change time. Limited on used market....
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S-GL-034
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TEL
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P12-XLn+
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Wafer Prober
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One of the more popular extensions of the P12-XL family, the "n" and "n+" improve overall alignment accuracy for smaller devices. Please contact...
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S-GL-035
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TEL
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P12-XL
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Wafer Prober
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The P12-XL is the most popular and broadly used of the 300mm P12 prober family and typically available in the market. Please contact us to verify...
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S-GL-036
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TEL
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P8-XL
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Wafer Prober
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This widely used 200mm wafer prober from TEL is still actively traded today, TEAM can provide options and upgrades with refurbed probers. Please...
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S-GL-037
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Delta
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MATRiX
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Chip Handler
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Delta's faster pick-and-place handler, the MATRiX offers up to 16,000 UPH for packages ranging from 2mm to 51mm. Limited availability. Please...
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S-GL-038
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Delta
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EDGE
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Chip Handler
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This pick-and-place handler from Delta is widely used in all segments for multi-site SOC package testing. Please contact us to verify...
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S-GL-039
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Delta
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Summit
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Chip Handler
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The Summit's specialized high power device and cooling capability limits its market use and activity. Please contact us to verify availability,...
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S-GL-040
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Delta
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Castle
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Chip Handler
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The lower relative throughput of this once leading handler limits its demand, but results in some low cost handler options for lower volume...
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S-GL-041
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Multitest
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M9918
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Chip Handler
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This tri-temp gravity handler introduced in 2001 features octal site parallel testing at up to 28,000 units per hour throughput. Device type is...
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S-GL-042
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Multitest
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M9928
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Chip Handler
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The M9928 along with its predecessor, the M9918, are both broadly used and have over 1000 units installed. Device type is key. Please contact us...
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S-GL-043
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Multitest
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M9320
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Chip Handler
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The last model in the M93xx gravity feed platform, the M9320 is a very flexible and fast handler. Still very limited availability. Please contact...
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S-GL-044
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Multitest
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M9308
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Chip Handler
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A very popular handler following its introduction in 1995, the M9308's lifecycle limits and device types are the key when looking in the used...
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S-GL-045
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Advantest
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M6242
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Chip Handler
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The M6242 is Advantest's highest throughput memory handler at 42,200 UPH and paired with the T5503 tester. Please contact us to verify...
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S-GL-046
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Advantest
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M6300
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Chip Handler
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The M6300 was introduced in 2005 and typically pairs with the 256 sites of a T5588 test station. Please contact us to verify availability,...
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S-GL-047
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Advantest
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M6542AD
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Chip Handler
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The M6542AD is still a popular memory handler, typically sold with the T5593 or T5377 testers. Please contact us to verify availability,...
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S-GL-048
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Rasco
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SO2000
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Chip Handler
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This smaller footprint gravity feed handler is popular for smaller devices and related input and output mechanisms. Please contact us to verify...
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S-GL-049
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Seiko-Epson
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NS-8000
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Chip Handler
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The NS-8000 series is the latest model in this popular series from Seiko Epson offering high throughput and wide range of options. Very limited...
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S-GL-050
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Seiko-Epson
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NS-7000
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Chip Handler
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The NS-7000 series offers several models at varying throughputs, input/output modules, and site counts. Please contact us to verify availability,...
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S-GL-051
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Agilent
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4083A
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Parametric Test
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The 4083A brings RF VNA measurement capability up to 20GHz to the 4080 family. Limited availabiltiy on the used market. Please contact us to...
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S-GL-052
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Agilent
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4082F
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Parametric Test
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Providing special high-voltage instrumetation for FLASH devices, the 4082F further extends the 4080 family. Limited availabiltiy on the used...
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S-GL-053
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Agilent
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4082A
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Parametric Test
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The 4082A is the mainstream model of the 4080 series, providing both ultra-low-current and high-frequency matrix cards. Please contact us to...
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S-GL-054
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Agilent
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4073B
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Parametric Test
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Similar to the 4073A, the 4073B had limited penetration into the broader markets. Please contact us to verify availability, configuration...
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S-GL-055
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Agilent
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4073A
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Parametric Test
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The market did not seem to see the value in the added capability of the 4073A, limiting its installed base and market activity. Please contact us...
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S-GL-056
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Agilent
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4072B
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Parametric Test
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The high-speed instrumentation and subsequent high throughput established a broad installed base for the 4072B. Please contact us to verify...
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S-GL-057
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HP
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4072A
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Parametric Test
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The 4072A is a popular member of the 4070 family, but not as widely used as the 4072B. Please contact us to verify availability, configuration...
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S-GL-058
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HP
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4071A
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Parametric Test
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This initial model of the 4070 series from HP (now Agilent), did not gain much traction and therefore has limited market activity. Please contact...
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S-GL-059
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HP
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4062UX
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Parametric Test
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This popular parametric tester dominated the market in the 1990s, but sees limited market activity today. For lower level testing, could be a...
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S-GL-060
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Advantest
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T5385
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Memory ATE
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This latest 768-site single-station tester from Advantest is targeted for wafer sort of FLASH and DRAM memory devices. Still limited availablity....
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S-GL-061
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Advantest
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T5385ES
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Memory ATE
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Designed for engineering use, this smaller version of the T5385 will have limited marketability. Please contact us to verify availability,...
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S-GL-062
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Advantest
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T5383
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Memory ATE
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The T5383 is a 384-site single-station tester designed for DDR SDRAM, SRAM, and FLASH wafer sort. Please contact us to verify availability,...
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S-GL-063
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Advantest
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T5377
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Memory ATE
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This two-station 128-site tester introduced in 2003 gained a large installed base during the memory segment buying in the mid-2000s. Please...
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S-GL-064
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Advantest
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T5377S
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Memory ATE
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This single-station version of the 128-site T5377, began the trend of single-station wafer sort solutions in the memory industry. Please contact...
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S-GL-065
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Advantest
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T5375
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Memory ATE
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The first 128-site DDR tester, the T5375 was widely used and still sees some trading today. Please contact us to verify availability,...
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