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Home  >  Semiconductor Test  >  SOC ATE / Mixed Signal  >  LTX-Credence Diamond X
LTX-Credence Diamond X
  • Equipment Description
    • SYSTEM OPTIONS:
    • 20-slot Testhead
    • 40-slot Testhead
    • 60-slot Testhead
    • Computer Type
    • Manipulator Type
    • Docking Type
    INSTRUMENT OPTIONS:
    • DPIN96 (DD1096-16)
    • DPIN96 (DD1096-32)
    • Dx-HSIO
    • VIS16
    • DPS16
    • HDVI
    • DIBU
    • MultiWave
    • D10 AWG
    • D10 Digitizer
    • DragonRF
    • RF Ports
    • RF Port Expander
    • RF Source
    • RF Measure

    LTX-Credence Diamond X

    The Diamond X extends the Diamond platform with larger configurations, but has a limited installed base. Please contact us to verify availability, configuration requirements and pricing.
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    PRICE Upon request
    ID# S-GL-016
    Make LTX-Credence
    Model Diamond X
    Class SOC ATE / Mixed Signal
    Requested
    Configuration
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    Quantity