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Home  >  Semiconductor Test  >  Chip Handler  >  Seiko-Epson NS-7000
Seiko-Epson NS-7000
  • Equipment Description
    • SERIES MODELS:
    • NS-7000
    • NS-7080
    • NS-7080W
    • NS-7160W
    TEST SITES:
    • 16-Site (8x2)
    • 8-Site (4x2)
    • Square 4-Site (2x2)
    • In-Line 4-Site (4x1)
    • 2-Site
    • Busy Shuttle (Single)
    PACKAGE TYPES:
    • QFP
    • TSOP
    • CSP
    • WLCSP
    • BGA
    • QFN
    • PLCC
    • LGA
    • PGA
    • RF Device
    • CMOS Image sensor

    Seiko-Epson NS-7000

    The NS-7000 series offers several models at varying throughputs, input/output modules, and site counts. Please contact us to verify availability, configuration requirements and pricing.
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    PRICE Upon request
    ID# S-GL-050
    Make Seiko-Epson
    Model NS-7000
    Class Chip Handler
    Requested
    Configuration
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    Quantity