MY INQUIRIES | Empty
English Chinese
Sign in Register
Home  >  Semiconductor Test  >  SOC ATE / Mixed Signal  >  Teradyne IP750
Teradyne IP750
  • Equipment Description
    • SYSTEM OPTIONS:
    • 512-Pin (8 slots) Testhead
    • 1024-Pin (16 slots) Testhead
    • Power Conditioner
    • Computer Type
    • Manipulator Type
    • Docking Type
    INSTRUMENT OPTIONS:
    • HSD100*
    • DPS
    • APMU
    • HDVIS
    • CTO
    • MSO
    IP INSTRUMENT OPTIONS:
    • IDP PC (1)
    • ICUD
    • ICUA
    * Please specify feature licenses

    Teradyne IP750

    The popular IP750 leverages the innovative architecture of the J750 into the image sensor test arena. Please contact us to verify availability, configuration requirements and pricing.
    ?
    PRICE Upon request
    ID# S-GL-006
    Make Teradyne
    Model IP750
    Class SOC ATE / Mixed Signal
    Requested
    Configuration
    Text paste *
    File attachment
    Quantity