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Home  >  Semiconductor Test  >  SOC ATE / Mixed Signal  >  Teradyne IP750EMP
Teradyne IP750EMP
  • Equipment Description
    • SYSTEM OPTIONS:
    • 512-Pin (8 slots) Testhead
    • 1024-Pin (16 slots) Testhead
    • Power Conditioner
    • Computer Type
    • Manipulator Type
    • Docking Type
    INSTRUMENT OPTIONS:
    • HSD100*
    • DPS
    • APMU
    • HDVIS
    • CTO
    • MSO
    IP INSTRUMENT OPTIONS:
    • IDP PC (1-8)
    • ICUD
    • ICUD2
    • ICUA
    • ICUA2
    * Please specify feature licenses

    Teradyne IP750EMP

    The IP750EMP is the second generation image sensor tester from Teradyne, offering faster capture and processing of image sensor test data. Please contact us to verify availability, configuration requirements and pricing.
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    PRICE Upon request
    ID# S-GL-007
    Make Teradyne
    Model IP750EMP
    Class SOC ATE / Mixed Signal
    Requested
    Configuration
    Text paste *
    File attachment
    Quantity