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Home  >  Semiconductor Test  >  SOC ATE / Mixed Signal  >  Teradyne J750
Teradyne J750
  • Equipment Description
    • SYSTEM OPTIONS:
    • 512-Pin (8 slots) Testhead
    • 1024-Pin (16 slots) Testhead
    • Power Conditioner
    • Computer Type
    • Manipulator Type
    • Docking Type
    INSTRUMENT OPTIONS:
    • HSD100*
    • MTO
    • DSIO
    • DPS
    • HVDPS
    • APMU
    • HDVIS
    • CTO
    • LMF (MSO)
    * Please specify feature licenses

    Teradyne J750

    The simple yet innovative design of the J750 makes this the most widely used test platform in the market today. TEAM is always looking for these systems. We can configure and refurb. Please contact us to verify availability, configuration requirements and pricing.
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    PRICE Upon request
    ID# S-GL-004
    Make Teradyne
    Model J750
    Class SOC ATE / Mixed Signal
    Requested
    Configuration
    Text paste *
    File attachment
    Quantity