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Home  >  Semiconductor Test  >  SOC ATE / Mixed Signal  >  Teradyne J750Ex
Teradyne J750Ex
  • Equipment Description
    • SYSTEM OPTIONS:
    • 512-Pin (8 slots) Testhead
    • 1024-Pin (16 slots) Testhead
    • Power Conditioner
    • Computer Type
    • Manipulator Type
    • Docking Type
    INSTRUMENT OPTIONS:
    • HSD100*
    • HSD200*
    • HSD800*
    • MTO
    • DSIO
    • DPS
    • HDDPS-24
    • HDDPS-48
    • HVDPS
    • APMU
    • HDVIS
    • CTO
    • HDCTO
    • LMF (MSO)
    * Please specify feature licenses

    Teradyne J750Ex

    The J750Ex extends the capabilities of the first-generation J750 to include higher speed and density instrumentation. TEAM is always looking for these systems. We can configure and refurb. Please contact us to verify availability, configuration requirements and pricing.
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    PRICE Upon request
    ID# S-GL-005
    Make Teradyne
    Model J750Ex
    Class SOC ATE / Mixed Signal
    Requested
    Configuration
    Text paste *
    File attachment
    Quantity